Documents

Below, you can find manuals for a number of our measurement capabilities.  These manuals are very thorough; if you follow them step by step and read carefully, you should not have any problems.  The people who have problems the most are those who accidentally skip steps because they are trying to work too quickly.  If you feel that you have found a mistake or something isn't clear, please contact Michael Koehler at mkoehler@utk.edu.

In "Other Documents," you can find information about our training policy and how to set up an account on the online billing/scheduling software (non-UTK users should contact me at mkoehler@utk.edu before doing this).  You can also find links to the IUCr round robin on quantitative analysis.  You can download the data and practice your Reitveld refinements.  There is also a link that will tell you the actual amounts of each phase in each sample.

Finally, you can find some good articles on different topics under Recommended Reading. 

 

Manuals -

Empyrean

Manuals -

X'Pert3 MRD

Other Documents

"Standard" Bragg-Brentano

XRD with PDS and reflection/

transmission/spinner stage

"Standard" Bragg-Brentano

XRD with PDS and XYZ Stage

Grazing-incidence XRD

(GIXRD)

Texture/Pole Figures

High-temperature XRD

(HTXRD) with Anton Paar HTK 1200N Stage

Fiber Diffraction

Microdiffraction and

Sample Mapping (coming soon)

X-ray Reflectivity

Training Info for UTK students and staff

Methods for Quantifying Amorphous Content

Residual Stress (coming soon)

 

Recommended Reading

McCusker, L. B. et al.  Rietveld Refinement Guidelines.  J. Appl. Cryst.32, 36-50 (1999)

Toby, B. H.  R factors in Rietveld analysis: How good is good enough?  Powder Diffraction 21(1), 67-70 (2006)